MAIA3 from TESCAN is a newly developed analytical scanning electron microscope which demonstrates ultra-high resolution of 1 nm at 15 kV. The resolution performance at 1 kV is 1.4 nm using secondary electrons and 0.8 nm at 30 kV in STEM mode. This powerful instrument is based on TESCAN’s proven three-lens column equipped with a Schottky field emission gun.
The spectacular resolution at low voltages is achieved by the unique construction of TESCAN’s 60 degree immersion objective lens which decreases optical aberrations dramatically compared to a conventional lens. An additional intermediate lens can operate simultaneously with, or instead of, the objective lens providing the possibility of multiple display modes.
Keeping the microscope in peak condition is now easy and requires a minimum of microscope downtime. Every detail has been carefully designed to maximize microscope performance and minimize operator’s effort.
Automatic set-up of the microscope and many other automated operations are characteristic features of the equipment. There are many other automated procedures which reduce the operator’s tune-up time significantly, enable automated manipulator navigation and automated analyses. SharkSEM remote control interface enables access to most microscope features, including microscope vacuum control, optics control, stage control, image acquisition, etc. The compact Python scripting library offers all these features.
A fully PC controlled ultra-high resolution FE-SEM intended for both – for high vacuum as well as for low vacuum operations. Outstanding electron-optical properties, flicker-free digital image with super clarity. Sophisticated user-friendly software for microscope control and image capturing using Windows™ platform.