TIMA

TESCAN TIMA

tima OK

TIMA – MINERAL ANALYZER

The TESCAN Integrated Mineral Analyzer. TIMA, a fully automated, high throughput, analytical scanning electron microscope is designed specifically for the mining and minerals processing industry. The TIMA solution will address applications such as Mineral Liberation Analysis,TESCAN, a world leading manufacturer of scanning electron microscopes and focused ion beam workstations has introduced the TESCAN Integrated Mineral Analyzer.

TIMA, a fully automated, high throughput, analytical scanning electron microscope is designed specifically for the mining and minerals processing industry. The TIMA solution will address applications such as Mineral Liberation Analysis, process optimization, remediation, and search for precious metals and rare earths. TIMA measures modal abundance, size-by-size liberation, mineral association, and performs PGM search automatically on multiple samples of grain mounts and thin or polished sections.

TESCAN’s unique technology is based on a completely integrated EDX system that performs full spectrum imaging at very fast scan speeds. Image analysis in TIMA is performed simultaneously with SEM backscatter electron images and a suite of x-ray images. The level of hardware integration of the SEM and EDX allows for unprecedented acquisition speeds for fully automated data collection, resulting in fast, accurate, repeatable and reliable results. process optimization, remediation, and search for precious metals and rare earths

TIMA Advantages:

• Very fast and fully automated data acquisition process reached via SEM and EDX high level hardware integration
• System based on MIRA or VEGA SEM platform proven by customers in many countries
• Special VEGA column design significantly extending tungsten filament lifetime
• Newly designed exchangeable sample holder with integrated fixed BSE/EDX calibration standard and Faraday cup
• Possibility to modify size of samples according to customer demands
• Up to 4 integrated EDX detectors for maximum system performance
• New Peltier cooled EDX detector type for thermal stability guarantee
• Improved approach to data analysis increasing speed and reliability of process
• Variable dwell time and EDX analysis duration adapting to each part of the sample
• Software released in three editions
• Various modules for data analysis
• Customizable classification rules
• Favorable price to performance ratio
• Custom solution possibilities